J/ApJS/131/561 Double stars with PISCO at Pic du midi (Scardia+, 2000)
Speckle observations of double stars with PISCO at Pic du midi:
measurements in 1998.
Scardia M., Prieur J.-L., Aristidi E., Koechlin L.
<Astrophys. J. Suppl. Ser. 131, 561 (2000)>
=2000ApJS..131..561S 2000ApJS..131..561S
ADC_Keywords: Stars, double and multiple
Keywords: astrometry - binaries: visual - stars: fundamental parameters
Abstract:
We present astrometric measurements of binary stars based on speckle
observations of 164 independent sequences of observations (∼104
frames each) made with the PISCO speckle camera at Pic du Midi. These
measurements concern 147 objects, of which 134 were found to be double
with a separation in the range 0.1"-1.0". These objects were mainly
selected among grade 3 orbits to improve the accuracy of their orbits
and to constrain their masses. We discovered the binarity of 59 Aql
with an angular separation of 0.09"±0.01".
File Summary:
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FileName Lrecl Records Explanations
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ReadMe 80 . This file
table1.dat 133 165 Relative Astrometric Data of the Binary Stars
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See also:
J/A+AS/134/545 : Double star measurements 1995-1997 (Aristidi+ 1999)
J/A+AS/105/503 : Binary star speckle measurements (Balega+ 1994)
J/A+AS/140/287 : 1992-1997 binary star speckle measurements (Balega+, 1999)
J/AJ/111/370 : Orbits of 37 close visual systems (Hartkopf+ 1996)
J/AJ/117/548 : 1997 WIYN binary stars speckle observations (Horch+, 1999)
J/AJ/106/352 : Speckle observations of binary stars VIII (Hartkopf+ 1993)
J/AJ/106/637 : ICCD speckle observations. IX (Mason+, 1993)
J/AJ/106/1639 : Speckle observations of binary stars (McAlister+ 1993)
J/AJ/108/2299 : ICCD speckle obs. of binary stars. XI. (Hartkopf+ 1994)
J/AJ/111/393 : Speckle observations of binary stars. XII (Al-Shukri+ 1996)
J/AJ/111/936 : ICCD Speckle obs. of binary stars. XIII (Hartkopf+ 1996)
J/AJ/119/3084 : ICCD speckle obs. of binary stars. XXIII. (Hartkopf+, 2000)
Byte-by-byte Description of file: table1.dat
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Bytes Format Units Label Explanations
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1- 10 A10 ---- WDS WDS designation (based in J2000 positions)
12- 38 A27 --- Names Other names
40- 41 I2 mm FL ? Focal length of the eyepiece used as imaging
lens in the magnification wheel
43- 47 A5 --- Filt Filter (1)
49- 56 F8.3 yr Epoch ? Epoch n Besselian years
58- 60 F3.1 arcsec Seeing ? FWHM seeing (2)
62- 66 F5.3 arcsec rho ? Angular separation
68- 72 F5.3 arcsec e_rho ? rms uncertainty on rho
74- 78 F5.1 deg PA ? Position angle
80- 82 F3.1 deg e_PA ? rms uncertainty on PA
83 A1 --- n_PA [*] Note on PA (3)
85-134 A50 --- Com Comments (4)
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Note (1): Characteristics of the Filters Used
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Name Central wavelength Bandwidth
(nm) (nm)
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B 447 47
O III 501 11
V 530 57
R 644 70
RL 743 69
W 650 418
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"W" means "White" since no filter has been used. In that case,
the bandwidth selection was done with the ICCD response only.
Note (2): FWHM seeing, which was measured on the long integration obtained by
adding all the elementary frames from that sequence
Note (3): The position angles have a 180° ambiguity except when asterisked
(for which a triple correlation method removed this ambiguity). The
origin of the orbits used in this table is indicated in the third
column with the name of the author and the year of the calculation.
Additional details about these orbits can be obtained directly from
those authors or from the author of this paper.
Note (4): Comments:
"(F)": The measurement was done in the Fourier space by fitting a model to
the fringes instead of measuring the position of the secondary peaks
of the autocorrelation function. This was preferentially done for
the closest binaries when the angular separation was less than 0.15"
because it gives a greater accuracy in this case.
"(F=)": The two methods (Fourier and autocorrelation) gave exactly the same
result.
"Fuzzy," "faint contrast": These terms are related to the secondary peaks of
the autocorrelation function.
"Artifacts close to the X-axis": This phrase is to note the presence of some
artifacts on the autocorrelation caused by the response of the ICCD to
individual photons. In some cases the corresponding pattern was close to
the secondary peaks of the binary and increased the measurement errors.
When the artifacts were superimposed on these peaks (i.e., for PA∼100°
or PA∼280°), we used the Fourier fitting method.
"Possible 1800 ambiguity": This means that the quadrant determination
(see the previous paragraph) was noisy and the result is uncertain.
For WDS 16563+6502, the two components were so widely separated that it was
also possible to do a direct measurement on the long integration.
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History:
Frome ApJS electronic version
(End) James Marcout, Patricia Bauer [CDS] 02-Feb-2001