J/ApJS/179/124    Subaru/XMM-Newton deep survey (SXDS) III.      (Ueda+, 2008)

The Subaru/XMM-Newton deep survey (SXDS). III. X-ray data. Ueda Y., Watson M.G., Stewart I.M., Akiyama M., Schwope A.D., Lamer G., Ebrero J., Carrera F.J., Sekiguchi K., Yamada T., Simpson C., Hasinger G., Mateos S. <Astrophys. J. Suppl. Ser., 179, 124-141 (2008)> =2008ApJS..179..124U 2008ApJS..179..124U
ADC_Keywords: X-ray sources ; Spectroscopy Keywords: catalogs - diffuse radiation - galaxies: active - X-rays: galaxies X-rays: general Abstract: We present the X-ray source catalog in the Subaru/XMM-Newton deep survey. A continuous area of 1.14deg2 centered at RA=02h18m and DE=-05° is mapped by seven pointings with XMM-Newton covering the 0.2-10keV band. From the combined images of the EPIC pn and MOS cameras, we detect 866, 1114, 645, and 136 sources with sensitivity limits of 6x10-16, 8x10-16, 3x10-15, and 5x10-15ergs/cm2/s in the 0.5-2, 0.5-4.5, 2-10, and 4.5-10keV bands, respectively, with detection likelihood ≥7 (corresponding to a confidence level of 99.91%). The catalog consists of 1245 sources in total including 32 extended-source candidates. The averaged logN-logS relations are in good agreement with previous results, bridging the flux range between Chandra deep surveys and brighter surveys. Description: The observations were performed in three discrete epochs, the first from 2000 July 31 to August 8 (for SDS-1 (central field), 2, 3, 4), the second from 2002 August 8 to 12 (for SDS-5, 6, 7), and the third on 2003 January 7 to supplement the unfulfilled exposure of SDS-4. File Summary: -------------------------------------------------------------------------------- FileName Lrecl Records Explanations -------------------------------------------------------------------------------- ReadMe 80 . This file table2.dat 173 1245 The X-ray source list of the SXDS -------------------------------------------------------------------------------- See also: B/xmm : XMM-Newton Observation Log (XMM-Newton Science Operation Center, 2002) J/A+A/466/823 : Hard 2-10kev X-ray selected sources (Georgantopoulos+, 2007) Byte-by-byte Description of file: table2.dat -------------------------------------------------------------------------------- Bytes Format Units Label Explanations -------------------------------------------------------------------------------- 1- 4 I4 --- [UWS2008] XMM source number in SXDS field (1) 6- 13 F8.5 deg RAdeg XMM Right Ascension (J2000) 15- 22 F8.5 deg DEdeg XMM Declination (J2000) 24- 28 F5.2 arcsec e_pos Statistical positional error (2) 30- 36 F7.1 --- L(US) Ultra-soft (0.3-0.5keV) band maximum likelihood 38- 44 F7.1 --- L(S) Soft (0.5-2keV) band maximum likelihood 46- 51 F6.1 --- L(M) Medium (2-4.5keV) band maximum likelihood 53- 58 F6.1 --- L(UH) Ultra-hard (4.5-10keV) band maximum likelihood 60- 66 F7.1 --- L(XID) XID (0.5-4.5keV) band maximum likelihood 68- 73 F6.1 --- L(H) Hard (2-10keV) band maximum likelihood 75- 79 F5.2 ct/ks CR(US) Ultra-soft (0.3-0.5keV) band count rate (3) 81- 84 F4.2 ct/ks e_CR(US) The 1σ uncertainty in CR(US) 86- 91 F6.2 ct/ks CR(S) Soft (0.5-2keV) band count rate (3) 93- 96 F4.2 ct/ks e_CR(S) The 1σ uncertainty in CR(S) 98-102 F5.2 ct/ks CR(M) Medium (2-4.5keV) band count rate (3) 104-107 F4.2 ct/ks e_CR(M) The 1σ uncertainty in CR(M) 109-113 F5.2 ct/ks CR(UH) Ultra-hard (4.5-10keV) band count rate (3) 115-118 F4.2 ct/ks e_CR(UH) The 1σ uncertainty in CR(UH) 120-124 F5.2 --- HR1 ? Hardness ratio 1 (4) 126-130 F5.2 --- e_HR1 ? The 1σ uncertainty in HR1 132-136 F5.2 --- HR2 ? Hardness ratio 2 (4) 138-142 F5.2 --- e_HR2 ? The 1σ uncertainty in HR2 144-148 F5.2 --- HR3 ? Hardness ratio 3 (4) 150-154 F5.2 --- e_HR3 ? The 1σ uncertainty in HR3 156 I1 --- Fld [1-7] Pointing ID where source detected (SDS) 158-161 F4.1 arcmin Off Offset angle (5) 163-167 F5.1 ks Exp Total pn-equivalent exposure (6) 169-171 F3.1 ct/Ms/arcsec2 bg Background rate in 0.5-4.5keV band at source 173 A1 --- Note [C] Multiple source (7) -------------------------------------------------------------------------------- Note (1): Sorted by Right Ascension and Declination. Note (2): The root sum square of the 1σ error in each direction. Note (3): Vignetting-corrected, pn-equivalent. Note (4): Where the hardness ratios defined as HR1=(S-US)/(S+US), HR2=(M-S)/(M+S), HR3=(UH-M)/(UH+M), where US, S, M, and UH are the count rates in the 0.3-0.5, 0.5-2, 2-4.5, 4.5-10keV band, respectively; Note (5): From the mean optical axis in the corresponding pointing. Note (6): Sum of pn, MOS1, and MOS2. At the source position corrected for the vignetting in the 0.5-4.5 keV band. Note (7): C indicates that multiple-source fitting was performed to obtain the fluxes, to take into account possible source confusion with nearby sources (see Section 3.2.3). -------------------------------------------------------------------------------- History: From electronic version of the journal References: Sekiguchi et al., Paper I. 2004AAS...205.8105S 2004AAS...205.8105S Furusawa et al., Paper II. 2008ApJS..176....1F 2008ApJS..176....1F Furusawa et al., Paper IV. 2008ApJS..176..301O 2008ApJS..176..301O, Cat. J/ApJS/176/301 Morokuma et al., Paper V. 2008ApJ...676..163M 2008ApJ...676..163M Morokuma et al., Paper VI. 2008ApJ...676..121M 2008ApJ...676..121M Yoshida et al., Paper VII. 2008ApJ...679..269Y 2008ApJ...679..269Y
(End) Greg Schwarz [AAS], Emmanuelle Perret [CDS] 15-Jul-2009
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