Astron. Astrophys. 363, 1177-1185 (2000)

Stark width and shift measurements of visible Si III lines

V.R. González, J.A. Aparicio, J.A. del Val  ^* and S. Mar

Universidad de Valladolid, Facultad de Ciencias, Departamento de Optica y Física Aplicada, 47071 Valladolid, Spain (victorg@opt.uva.es)

Received 12 July 2000 / Accepted 21 August 2000

Abstract

A set of experimental Stark width and shift parameters of visible doubly ionized silicon spectral lines is reported in this paper. Measurements have been made on a pulsed plasma generated in a linear discharge lamp filled with a mixture of silane and helium. Electron density and temperature in this plasma range from 0.2 to m^-3 and from 17 500 to 21 000 K respectively. Electron density has been simultaneously determined by two-wavelength interferometry and from Stark broadening of HeI 501.6 nm, HeI 728.1 nm and lines. Temperature has been simultaneously determined from Boltzmann-plot of HeI lines, from absolute emission of HeI lines, from Boltzmann-plot of SiII lines and from SiIII /SiII intensities ratio. Dependencies of measured Stark parameters with electron density and temperature have been investigated and the final results have been compared with most of the previous experimental data as well as with some theoretical models.

Key words: atomic data atomic processes line: profiles plasmas

* Permanent address: Universidad de Salamanca, Departamento de Física Aplicada, E. Politécnica Superior, 05071 Avila, Spain

Send offprint requests to: S. Mar

© European Southern Observatory (ESO) 2000

Online publication: December 5, 2000

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